Imaging microwave electric fields using a near-field scanning microwave microscope
نویسندگان
چکیده
منابع مشابه
Scanning Microwave Microscope
Introduction Measuring electromagnetic properties of materials can provide insight into applications in many areas of science and technology, and increasingly, these properties need to be evaluated at the nanometer scale. Since electromagnetic properties, such as the dielectric constant, are ultimately related to a material’s molecular structure, correlating the detailed physical structure of a...
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ژورنال
عنوان ژورنال: Applied Physics Letters
سال: 1999
ISSN: 0003-6951,1077-3118
DOI: 10.1063/1.123137